By Susan Brooks(eds.)
The booklet is worried with the speculation, history, and useful use of transmission electron microscopes with lens correctors that may right the consequences of round aberration. The ebook additionally covers a comparability with aberration correction within the TEM and purposes of analytical aberration corrected STEM in fabrics technological know-how and biology. This e-book is key for microscopists desirous about nanoscale and fabrics microanalysis specifically these utilizing scanning transmission electron microscopy, and comparable analytical innovations comparable to electron diffraction x-ray spectrometry (EDXS) and electron strength loss spectroscopy (EELS).Content:
Chapter 1 basic creation to Transmission Electron Microscopy (TEM) (pages 1–19): Peter Goodhew
Chapter 2 creation to Electron Optics (pages 21–38): Gordon Tatlock
Chapter three improvement of STEM (pages 39–53): L. M. Brown
Chapter four Lens Aberrations: analysis and Correction (pages 55–87): Andrew Bleloch and Quentin Ramasse
Chapter five concept and Simulations of STEM Imaging (pages 89–110): Peter D. Nellist
Chapter 6 information of STEM (pages 111–161): Alan Craven
Chapter 7 Electron power Loss Spectrometry and effort Dispersive X?ray research (pages 163–210): Rik Brydson and Nicole Hondow
Chapter eight purposes of Aberration?Corrected Scanning Transmission Electron Microscopy (pages 211–240): Mervyn D. Shannon
Chapter nine Aberration?Corrected Imaging in CTEM (pages 241–261): Sarah J. Haigh and Angus I. Kirkland
Read Online or Download Aberration-Corrected Analytical Transmission Electron Microscopy PDF
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Extra resources for Aberration-Corrected Analytical Transmission Electron Microscopy
These simple requirements imply that in most cases we must prepare a thin specimen from a larger sample, and in all cases we must assure ourselves that the processes of preparation, mounting and examination do not change, in any uncontrolled way, the important features of the specimen. For high resolution studies, whether imaging or analysis, the constraints are more severe. The ideal specimen must be thin enough that: • it can be treated as a weak phase object (see below); • electron beam spreading within the specimen is negligible; • (if a nano-particle) it can be supported on a thin substrate with the total thickness still small enough to satisfy the two constraints listed above; GENERAL INTRODUCTION-TRANSMISSION ELECTRON MICROSCOPY 15 .
B. (2009) Transmission Electron Microscopy (2nd edn), Springer, New York. M. 1 INTRODUCTION: STRUCTURAL AND ANALYTICAL INFORMATION IN ELECTRON MICROSCOPY The purpose of this chapter is to present in concise and readable form an outline of the development of scanning transmission electron microscopy. It is remarkable to think that until 1933 (Ruska, 1986) no one had seen a detail of an object smaller than about half a micron – 500 nm. Nowadays, the entire field of nanotechnology occupies the domain from atomic size to about 100 nm.
1996), most microscopes employ lenses to produce increased magniﬁcation of an object. Provided that the object is outside the focal length of the lens, this will lead to a projected, inverted image, which can be used as the object for the next lens, and so on. A typical compound microscope arrangement is illustrated in Aberration-Corrected Analytical Transmission Electron Microscopy, First Edition. Edited by Rik Brydson. 2011 John Wiley & Sons, Ltd. Published 2011 by John Wiley & Sons, Ltd.